A new method for measuring three different properties of light, at the same time, has been developed using an ...
EPFL researchers have developed a method to calibrate electron spectrometers with extreme accuracy by linking microwave, ...
There is an increasing need for highly accurate 3D inspection and measurement capabilities for applications in SMT, semiconductor and metrology markets. 3D Multiple Reflection Suppression (MRS) sensor ...
Novel Technology Enhances Operating Speed, Unlocking Faster Neutral Atom Quantum Computer Runtimes SLM’s silicon-germanium (SiGe) MEMS technology integrates high-speed, non-contact piston phase ...